Equipment parameters:
Description | Specifications |
Model | V2000 |
Applications | Die Bond / Wire Bond Multi Layer Wire Defect Inspection Machine |
Maximum Number of Inspection Attributes (Number of Defects) | 30+ |
Advantages | Inspection Resolution (μm/pixel): 2D: 2.6μm/pixel 3D: XY Resolution: 3.6μm/pixel, Z-direction Accuracy: ±10μm Number of Cameras (Enumerate Each):2D Camera*1 and 3D camera*1 FOV (field of view):12mm*12mm Scanning Speed (per L/F):16s % Over Rejection≤500PPM % Under Rejection≤100PPM |
Performance Characteristic | MTBA≥2H MTBF≥168H GR&R<10% UPH≥180 strips/h (LF size: 212mm x 63.42mm; Die size: 4.9mm x 4.44mm; No. of Unit per Strip: 5 rows and 22 columns) Minimum Package Size Capability (body size):All Packages Maximum Leadframe Size Capability (L/F size):100mm*300mm |
Inspection System | Die Detection Solder Inspection Welding Wire Inspection Glue/Soldering Tin Inspection Frame/Pin Detection |
Machine Auxiliaries | Leadframe Handler (Transfer Method) Leadframe Jam Detect Sensors Leadframe Rail Presence Sensor (Input and Output) Magazine Handler (IP/OP module) Barcode Scanner (lot processing) ESD Lonizers SECS/GEM |
2D Coding and Strip Map | QR Code (Data Matrix) Reader Strip Map Capability |
Operating System / Interface | Windows 10 Pro 19045.4894 |
Facility Requirements | Power Supply: AC220±10%V, 50Hz, 4.3kW Air Source: 0.5~0.6MPa, Inlet Pipe φ10mm, Air Consumption 200mL/min Temperature: 10°C – 35°C, Humidity 30% – 70%RH, (Non-Condensing) |
*The above parameters are subject to the actual product