Equipment parameters：
| Description | Specifications |
| Model | JRS-801H |
| Applications | High Temperature Semiconductor Test, Inspection and Packaging |
| Process / Applications | QFP、TQFP、CSP、PLCC、QFN、BGA、LGA、PGA、TSOP, etc |
| Temp Accuracy | 50°C~100°C±2°C 100°C~130°C±3°C |
| Temp Range | Constant Temp to 150°C |
| Performance Characteristic | Max.UPH:13,000 (Ambient Temp) MTBA≥2H MTBF≥168H Change Kit＜30min Testing Pressure: Max240kg |
| ESD | Class 1(±35V, 3s) Class 0+Close Loop(±10V， 2s，Real-time Ionic Concentration Detection)(Optional) |
| Standards | CE, UL |
| Inspection System(Optional) | Optional 1：QR Code Detection Optional 2： OCR Detection |
| Input / Output | Bowl, Tube, Tray |
| Communication Interface | TTL, GPIB, RS232, TCP/IP |
| Operating System | WIN7 |
| Facility Requirements | Operating Voltage：AC 220±10%V，50/60Hz， Air Pressure Requirements: 0.4~0.7Mpa Power：6KW |
| Dimensions | Overall Dimension: 1960*1540*2000mm (Signal Excluded) Weight: 1450kg |
*The above parameters are subject to the actual product
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